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Dual ion beam TEM at CSNSM, Orsay (JANNuS-Orsay)


The 4th international workshop on Transmission Electron Microscopy with in-situ irradiation is organized in Orsay, France, from the 16th March to the 18th of March, 2016.

The workshop will focus on the combination of TEM with in situ ion and electron irradiation. We hope that representatives of both current and planned facilities will be present. Areas for discussion will include advances in electron microscopy and ion irradiation techniques as well as current and future research. All scientific fields utilizing the technique will be covered including: nuclear materials, radiation effects in semiconductors, nanostructural modification, single and multi ion effects, …

We are looking forward seeing you in France!


Contact : wotwisi-4(at)csnsm.in2p3.fr
Address: WOTWISI-4, CSNSM, Univ Paris-Sud and CNRS, Bât. 104-108, 91405 Orsay cedex, France